Performance Check of a Wavelength Dispersive X-Ray Spectrometer (WDS) attached to the SEM
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چکیده
منابع مشابه
Wavelength-dispersive spectrometer for X-ray microfluorescence analysis at the X-ray microscopy beamline ID21 (ESRF)
The development of a wavelength-dispersive spectrometer for microfluorescence analysis at the X-ray Microscopy ID21 beamline of the European Synchrotron Radiation Facility (ESRF) is reported. The spectrometer is based on a polycapillary optic for X-ray fluorescence collection and is operated in a flat-crystal geometry. The design considerations as well as operation characteristics of the spectr...
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Line shapes of atomic lines and soft x-ray emission bands measured with a wavelength dispersive spectrometer (WDS) with the Electron Probe Micro Analyzer (EPMA) are reviewed. Least square fitting to pseudo-Voigt profiles of the digitally measured spectra are used to account for the presence of non-diagram features (high and low energy satellites) and instrumental induced distortions. The effect...
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In setting up the conditions for quantitative wavelength-dispersive electron microprobe analysis a number of parameters have to be defined for each element, namely accelerating voltage, beam current, and (for each element) x-ray line, spectrometer crystal, pulse-height analyser settings, background offsets, and counting times for peak and background. The choices made affect both the reliability...
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Ultrafast X-ray absorption spectroscopy (XAS) performed at an x-ray free electron laser (XFEL) is a potentially very powerful tool to study numerous phenomena including dissociation in the gas phase , phase transitions in material science 2 and metal ligand charge transfer reactions 3 in coordination chemistry (for a recent review see ). At energies of 5-8 keV the LCLS is expected to provide pu...
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ژورنال
عنوان ژورنال: Microscopy and Microanalysis
سال: 2009
ISSN: 1431-9276,1435-8115
DOI: 10.1017/s1431927609094112